FIB Tutorials

Introduction: Focused Ion Beam Systems Focused ion beam (FIB) systems have been produced commercially for approximately ten years, primarily for large semiconductor manufacturers. FIB systems operate in a similar fashion...	FIB Deformation Contrast Deformation Contrast highlights the variation in conductivity within the image. Both FIB (focused ion beam) secondary electron and secondary ion images exhibit deformation contrast, which can be...	FIB Voltage Contrast An array structure containing failing contacts has been parallel lapped to reveal the top of the contacts. FIB (focused ion beam) passive voltage contrast imaging lights up...
FIB Chemical Contrast Both FIB(focused ion beam) secondary electron and secondary ion (SI) images exhibit chemical contrast, but in SE images it is much less interpretable than SEM BSE images...