Fibics Incorporated provides analysis solutions to semiconductor and materials science / metallurgy clients, specializing in focused ion beam (FIB), secondary ion mass spectrometry (SIMS) and transmission electron microscopy (TEM).

FIB applications include micromachining, specimen preparation, circuit edit, microsurgery, device modification, sectioning and imaging, with a high degree of site specific precision.

SIMS applications include depth profiling, dopant mapping, ultra shallow junction measurement, isotope imaging, and image depth profiling.

TEM applications include imaging, lattice imaging, dielectric and metallization measurement, characterization, diffraction analysis, EDX and EELS chemical mapping (including analytical electron microscopy (AEM)).