FibicsOffering FIB oriented solutionsOur goal of developing applications of Focused Ion Beam (FIB) microscopy in the fields of Metallurgy and Materials Science. Since acquiring its first FIB in 1997, Fibics has developed an international reputation for its work in both metallurgy/materials science and semiconductor device modification (microsurgery) as well as in TEM specimen preparation, “nanomachining” and analysis. |
ApplicationsHave a look at what a FIB can do
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Image GalleryAll the weird and wonderful world of FIB/SEM Imaging
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