Fibics
Offering FIB oriented solutions
Our goal of developing applications of Focused Ion Beam (FIB) microscopy in the fields of Metallurgy and Materials Science. Since acquiring its first FIB in 1997, Fibics has developed an international reputation for its work in both metallurgy/materials science and semiconductor device modification (microsurgery) as well as in TEM specimen preparation, “nanomachining” and analysis.
Applications
Have a look at what a FIB can do
- FIB Sectioning & Imaging of Powders and Particulates
- Site-specific TEM Specimen Preparation of Grain Boundary Corrosion in Nickel-Based Alloys Using the FIB "Plan-View Lift-Out" Technique
- Secondary electron vs. secondary ion image mode of FIB imaging - Part I
- FIB Sectioning and Imaging of Painted, Galvanized Autobody Steel
- Sectioning Through an Aluminum Beverage Can and Polymer Label
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