FIB Applications

Material Science

FIB Sectioning & Imaging of Powders and Particulates FIB cross-sectioning and imaging of Ni powders. In both cases the powders were sprinkled on conductive carbon tape and any excess was blown off. No...	Site-specific TEM Specimen Preparation of Grain Boundary Corrosion in Nickel-Based Alloys Using the FIB "Plan-View Lift-Out" Technique Use of the focused ion beam (FIB) microscope allows site-specific specimen preparation for TEM analyses in a routine manner not realizable with any other technique....	FIB Sectioning and Imaging of Painted, Galvanized Autobody Steel This section illustrates the relative insensitivity of FIB sectioning to variations in specimen density and hardness. Here, a relatively soft, polymeric paint layer with particle reinforcement covers...
Sectioning Through an Aluminum Beverage Can and Polymer Label This FIB image shows a FIB cross-section into an aluminum beverage can, tilted to 45° and imaged in the FIB in secondary electron mode. The polymer...	Using FIB Secondary Ion Images to Observe the Presence of Corrosion Comparative FIB images of a crack in a pipeline steel are shown, acquired using secondary electron and secondary ion signals. The ion image (inset) highlights...	Focused Ion Beam TEM Specimen Preparation of Oxide Films on Zirconium-based Alloys Precision, "stress-free" FIB sectioning can be used to prepare EELS thin TEM cross-sections of "challenging" specimens, such as this surface oxide grown in 300°C water...

Nanofabrication

Steps in TEM Specimens Preparation by "Lift-out" Method

The "lift-out" technique has numerous qualities that make it attractive to industry requiring TEM analysis. The total fabrication time for a site specific TEM specimen...