FIB Deformation Contrast Deformation Contrast highlights the variation in conductivity within
the image. Both FIB (focused ion beam) secondary electron and secondary ion images exhibit
deformation contrast, which can be thought of as a subset of orientation
contrast, and is the least studied FIB contrast mechanism.
For FCC metals in particular, FIB SE & SI images are sensitive to increased dislocation density, slip bands and the presence of subgrain boundaries, revealing a "mottled" and nonuniform contrast as the degree of deformation within a grain increases. |
