Fibics Pattern
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FIB
  • FIB for Semiconductor Applications
  • Device Modification (Microsurgery)
  • Probe Pad & Window Creation
  • Parallel Lapping
  • TEM Specimen Preparation
    • TEM
  • TEM for Semiconductor Applications
    • SIMS
  • SIMS for Semiconductor Applications
  • Application Examples
  • Additional Analytical Services
    • TEM for Semiconductor Applications
    Fibics Incorporated offers TEM services for the semiconductor industry. We would be very happy to discuss your TEM specific requirements. Please contact us for more information about our TEM services.
    Fibics has on-site access to the following analysis equipment, and offers expert services in:
    Philips CM20 Field Emission Transmission / Scanning Transmission Electron Microscope (TEM/STEM)
  • Gatan Imaging Filter (GIF) for Electron Energy Loss Spectroscopy (EELS) and Energy Filtered Imaging
  • Link Energy Dispersive X-ray Spectroscopy (EDX) detector system capable of light element analysis & x-ray mapping
  • Analytical software for phase identification using Convergent Beam Electron Diffraction (CBED) patterns
    • Philips EM400T TEM
  • Gatan Parallel EELS (PEELS)
  • EDAX EDX detector
  • Analytical software for phase identification using Convergent Beam Electron Diffraction (CBED) pattern
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