Fibics Pattern
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FIB
  • FIB for Semiconductor Applications
  • Device Modification (Microsurgery)
  • Probe Pad & Window Creation
  • Parallel Lapping
  • TEM Specimen Preparation
    • TEM
  • TEM for Semiconductor Applications
    • SIMS
  • SIMS for Semiconductor Applications
  • Application Examples
  • Additional Analytical Services
    • TEM Specimen Preparation by FIB
    Lift-out TEM Specimen Preparation


  • Introduction to TEM Specimens Prepared by FIB
  • Conventional "H-bar" TEM Specimen Preparation
  • "Lift-out" TEM Specimen Preparation
  • "H-Bar Lift-Out" and "Plan-View Lift-Out"

    • Application Examples
  • TEM Image of a Microprocessor Prepared by FIB
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